Showing results: 541 - 555 of 570 items found.
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Keysight Technologies
The Keysight Satellite Signal Monitoring, Reference Solution is a fast, effective solution for monitoring large blocks of spectrum combined with precise digital modulation analysis to validate satellite signal integrity up to 50 GHz. Built upon a modular instrument format (PXIe), its attributes include: excellent instrument density, expandable multi-channel support, and high data bus speeds, ideal for multi-band monitoring. To provide flexibility, a choice of vector signal analyzers (M9391A and M9393A) is available to tailor the system frequency ranges as needed.
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DPNA-6G AXIe -
Holding Informtest
The AXI DPNA-6G module is the world's first network analyzer in the form factor of the AXIe-1 module, as well as the first Russian device that meets the AXIe-1 standard. In the mode of the network parameters meter, the AXI DPNA-6G module measures the vector values of the network parameters on two ports: transmission coefficients (S12, S21) and reflection (S11, S22). At the same time, all necessary types of calibrations are supported: one- and two-port short-circuit, XX, matched load, transmission normalization. The software supports the import of third party calibration standard parameters. In the measuring receiver mode, the module provides:*generation of a harmonic signal (frequency synthesizer);*spectrum analyzer and power level in a given band;*measuring the frequency of a known signal;*measurement of analog modulation parameters;*phase noise measurement.
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Talon RTS 2620 -
Pentek, Inc.
- Search and capture system using Sentinel™ Intelligent Signal Scanner- Captures RF signals up to 6 GHz- Capture and scan bandwidths up to 40 MHz- 30 GHz/sec scan rate- Selectable threshold triggered or manual record modes- 16-bit A/D with 75 dB SNR & 87 dB SFDR- Built-in DDC with selectable decimation range from 2 to 65,536- Built-in DUC with selectable interpolation range from 2 to 65,536- 3U to 6U 19-inch rackmount server chassis with hot-swappable HDDs- Storage capabilities to 192 TB- RAID levels of 0, 5, and 6- Windows® workstation with Intel Core™ i7 processor- Optional RF upconversion- SystemFlow® GUI with virtual Oscilloscope, Spectrum Analyzer and Spectrogram displays
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Vanguard -
Ellisys Sàrl
The most advanced, most comprehensive Bluetooth protocol analyzer ever made. Building on a legacy of innovation, the Bluetooth Vanguard All-In-One Protocol Analysis System delivers new advances designed to ease the increasingly complex tasks of Bluetooth developers. Vanguard provides synchronized capture and analysis of BR/EDR, Bluetooth Low Energy, Wi-Fi 802.11 a/b/g/n/ac (3x3), WPAN 802.15.4 (all 16 2.4 GHz channels), raw 2.4 GHz RF spectrum analysis, HCI (USB, UART, SPI), generic SPI/UART/I2C/SWD communications, WCI-2, logic signals, and Audio I2S.
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783156-02 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783124-01 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-01 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783124-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783156-03 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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783124-02 -
NI
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR … test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Optoplex Corporation
Optoplex’s near-infrared optical spectrum analyzer module (NIR OSA) is a high performance optical spectral engine for Process Analytical Technology (PAT) and Fiber Optic Test Equipment (FOTE) applications. Based on proprietary technologies, Optoplex’s OSA module offers much higher spectral resolution capability than those available in the market, which is demanding in today’s increasing spectroscopy applications. Other features include: compact, light-weight, low power consumption and wide wavelength coverage. Optoplex’s compact OSA engines are suitable for a variety of handheld, portable, bench-top and inline OSA/spectrometer applications.
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LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
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mks Ophir
The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.
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OPT 80 -
Unaohm Start S.r.l.
Calibrated measurement of the optical power of satellite and terrestrial TV signals distributed in optical fiber Calculation of optical signal losses on distribution Measurement of digital parameters (BER - MER - NM etc.) of optical signals converted into RF Visualization of optical carriers in RF Field Metric Spectrum Analyzer Power Meter Optical Field Meter Display Optical RF Power Supply Line Link Meter (LNB power supply ) Optical LNB power supply 13V 500mA with short circuit and overload managementAcquisition of optical measurements using the field meter Data Logger Option: certification of the OPT80 calibration and optical power measurements
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SX set -
Langer EMV-Technik GmbH
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
